A method for characterizing effective intensity of Franz-Keldysh effect in(HgCd)Te detectors

Authors
Li, ZD Ye, YT Wu, YF Shu, HH He, LL Li, DZ Wu, ZM
Citation
Zd. Li et al., A method for characterizing effective intensity of Franz-Keldysh effect in(HgCd)Te detectors, J INF M W, 20(5), 2001, pp. 353-355
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF INFRARED AND MILLIMETER WAVES
ISSN journal
10019014 → ACNP
Volume
20
Issue
5
Year of publication
2001
Pages
353 - 355
Database
ISI
SICI code
1001-9014(200110)20:5<353:AMFCEI>2.0.ZU;2-G
Abstract
A simple method for characterizing effective intensity of Franz-Keldysh eff ect of (HgCd)Te detectors was presented. It is using the output ratio of di fferent bias voltage instead of wavelength shift to characterize effective intensity of Franz-Keldysh effect. The experimental result shows this metho d is effective and practical.