In situ X-ray diffraction study of P2-Na-2/3[Ni1/3Mn2/3]O-2

Authors
Citation
Zh. Lu et Jr. Dahn, In situ X-ray diffraction study of P2-Na-2/3[Ni1/3Mn2/3]O-2, J ELCHEM SO, 148(11), 2001, pp. A1225-A1229
Citations number
10
Categorie Soggetti
Physical Chemistry/Chemical Physics","Material Science & Engineering
Journal title
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
ISSN journal
00134651 → ACNP
Volume
148
Issue
11
Year of publication
2001
Pages
A1225 - A1229
Database
ISI
SICI code
0013-4651(200111)148:11<A1225:ISXDSO>2.0.ZU;2-8
Abstract
The electrochemical extraction and insertion of Na in P2-Na-2/3[Ni1/3Mn2/3] O-2 was studied by in situ X-ray diffraction. All the original Na can be ex tracted from P2-Na-2/3[Ni1/3Mn2/3]O-2 and it can be reversibly inserted aga in. When x > 1/3 in Na-x[Ni1/3Mn2/3]O-2, the compound remains in the P2 str ucture. For x approximate to 1/3, a small amount of O-2-type stacking fault s are introduced into the structure. When x < 1/3, the electrode exists as two coexisting phases. These are P2-Na-1/3[Ni1/3Mn2/3]O-2 (with some O-2-ty pe stacking faults) and [Ni1/3Mn2/ 3]O-2. [Ni1/3Mn2/3]O-2 adopts the O-2 st ructure with stacking faults. As sodium is reinserted in [Ni1/3Mn2/3]O-2 to make Na-1/3[Ni1/3Mn2/3]O-2 the P2 structure forms again. The evolution of the lattice parameters of P2-Na-x[Ni1/3Mn2/3]O-2 (1/3 < x < 2/3) with x and the lattice constants of [Ni1/3Mn2/3]O-2 are also reported. (C) 2001 The E lectrochemical Society.