Electron backscatter diffraction analysis of recrystallized grains formed in deformation band in aluminum single crystal

An aluminum single crystal of (110) (110) orientation was deformed in tensi on and annealed to obtain partial recrystallization. In a special type of b and of secondary slip (SBSS), many recrystallized grains (RGs) were formed. The orientation and the morphology of RGs were examined by an electron bac kscatter diffraction method. Many RGs exhibited elongated morphology along the trace of primary or sub-primary slip plane. The RGs elongated along the primary slip trace exhibited crystal rotation with respect to the average SBSS crystal orientation, about axes close to the primary plane normal. For the RGs elongated along the sub-primary slip trace, the crystal rotation a xes were close to the sub-primary plane normal. In the interior of the samp le, about 250 mum beneath the original surface, only one RG was detected. T his interior RG had an orientation similar to that of the majority of RGs f ormed at the original surface. The rotating angle was almost exactly 40 deg rees (40 degrees (111) rotation) for the interior RG, while the rotating an gles for the surface RGs distributed in relatively wide range.