The parameter extraction language (PEL) in Agilent IC-CAP software is used
to develop an automatic macro program for the analysis of the characteristi
cs of RF MOSFETs. By using this powerful macro program, the time spent on t
he measurement of the MOSFET characteristics and the related analysis is ef
fectively reduced. This macro program permits a fast and accurate method to
obtain the DC and RF characteristics of MOSFETs with different device geom
etries and operating conditions. It is also suitable for high volume measur
ements and analyses of MOSFET, and provides a solid jou 71 dation for RF ci
rcuit design.