Updated NIEL calculations for estimating the damage induced by particles and gamma-rays in Si and GaAs

Systematic calculations of the non-ionizing energy losses (NIEL) have been performed for electrons, protons, neutrons and gamma -rays in Si and GaAs f or a wide range of particle energies. Well-established theoretical approach es as well as newly-developed data (ENDF/B-VI for protons and neutrons) hav e been used for calculating the differential cross sections for energy tran sfer to the recoils which in turn produce displacement damage. Some differe nces, found between our calculations and other works, have been explained. Equivalent fluences of particles, i.e. those introducing the same displacem ent damage, have been estimated. The updated calculations and models presen ted here are useful for assessing device performance in space and laborator y tests. Crown Copyright (C) 2001 Published by Elsevier Science Ltd. All ri ghts reserved.