Nanocrystalline silicon (nc-Si:H) attracts a great deal of attention due to
the hope for more efficient and stable solar cells, as well as better thin
-film transistors and optical sensors. In this study, we report on improvem
ents in the structural and electronic qualities of intrinsic nc-Si:H grown
from hot-wire chemical vapour deposition. For examining a wide range of dep
osition parameters, we use a design-of-experiments approach. In contrast to
our previous films obtained from tungsten and tantalum filaments, a novel
type of filament greatly enhances preferential growth in the < 110 > direct
ion over a wide range of deposition conditions. General considerations on t
he orientation and electronic activity of grain boundaries in polycrystalli
ne silicon explain why the electronic quality of this < 110 > -oriented fil
m is remarkably higher than the one previously grown, mixed-phase nanocryst
alline silicon. Mobility-lifetime products of films from our novel filament
s are two orders of magnitude higher than those of samples from Ta wires. I
n photoluminescence spectra, no band tail contributions occur, and the amor
phous and defect peaks are greatly reduced. Moreover, the transverse optica
l Raman signal is red-shifted, and thereby indicates a reduction in mechani
cal strain in our novel nanocrystalline silicon films. (C) 2001 Elsevier Sc
ience B.V. All rights reserved.