G. Michalek et Br. Bulka, Negative differential resistance and super-poissonian shot noise in a system of single electron transistors, ACT PHY P A, 100(3), 2001, pp. 431-436
Currents and their fluctuations in two capacitively coupled single electron
transistors were studied within the sequential tunneling approach. A speci
al attention was focused on the effect of the negative differential resista
nce, which appears due to the Coulomb interactions of accumulated charges o
n both the single electron transistors. In this case large polarization flu
ctuations are activated, which results in a significant enhancement of the
current shot noise.