We introduce a method for detecting and tracking small particles in a solut
ion near a surface. The method is based on blocking the backreflected illum
ination beam in an objective-type total internal reflection microscope, lea
ving unhindered the light scattered by the particles and resulting in dark-
field illumination. Using this method, we tracked the motion of 60-nm polys
tyrene beads with a signal-to-noise ratio of 6 and detected 20-nm gold part
icles with a signal-to-noise ratio of 5. We illustrate the method's use by
following the Brownian motion of small beads attached by short DNA tethers
to a substrate. (C) 2001 Optical Society of America.