I. Ohlidal et al., Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances, APPL OPTICS, 40(31), 2001, pp. 5711-5717
In this contribution a new efficient modification of a method that enables
us to perform the optical characterization of nonabsorbing and weakly absor
bing thin films without using the absolute values of the reflectances measu
red is presented. Namely, this modification is based on determining the val
ues of the wavelengths corresponding to touching the spectral dependences o
f the reflectances of the studied films measured for several angles of inci
dence with the envelopes of maxima and minima of these spectral dependences
. By means of combining the explicit formulas containing the wavelengths me
ntioned and the suitable iteration procedure one can evaluate the values of
the thicknesses and spectral dependences of the refractive indices of the
films analyzed in reliable and precise ways. (C) 2001 Optical Society of Am
erica.