Fault detection in a tristate system environment

Authors
Feng, FY Karimi, F Lombardi, F
Citation
Fy. Feng et al., Fault detection in a tristate system environment, IEEE MICRO, 21(5), 2001, pp. 77-85
Citations number
11
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE MICRO
ISSN journal
02721732 → ACNP
Volume
21
Issue
5
Year of publication
2001
Pages
77 - 85
Database
ISI
SICI code
0272-1732(200109/10)21:5<77:FDIATS>2.0.ZU;2-M
Abstract
EMBEDDED COMPUTERS COMMONLY RELY ON MULTIPLE-BOARD SYSTEMS, CALLED TRISTATE SYSTEM ENVIRONMENTS. THESE ENVIRONMENTS CONSIST OF AN INTERCONNECT AND DRI VERS OR RECEIVERS WITH TRISTATE FEATURES AND BOUNDARY SCAN CAPABILITIES. TH E AUTHORS PRESENT A COMPREHENSIVE FAULT MODEL THAT PROVIDES 100 PERCENT FAU LT COVERAGE AND MINIMIZES TEST SET SIZE.