Fast S-parameter extraction method for the analysis of planar structures using the method of moments

Citation
Bla. Van Thielen et Gae. Vandenbosch, Fast S-parameter extraction method for the analysis of planar structures using the method of moments, INT J RF MI, 11(6), 2001, pp. 404-415
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING
ISSN journal
10964290 → ACNP
Volume
11
Issue
6
Year of publication
2001
Pages
404 - 415
Database
ISI
SICI code
1096-4290(200111)11:6<404:FSEMFT>2.0.ZU;2-L
Abstract
This article describes a new fast method that yields an S-parameter's descr iption for a structure immediately after solving the method of moments (MoM ) matrix. A virtual elongation is added to the line without extra coupling calculations. The line can be excited by imposing traveling waves with the correct propagation constant and current profile on this elongation. The el ongation is also used to modify the line's self-coupling matrix (without ch anging its size) to make it appear as though it is terminated in a matched load at its fed end. The described method allows a close integration betwee n the method of moments and S-parameter circuit solvers. (C) 2001 John Wile y & Sons, Inc.