Electromagnetic analysis of axially symmetric diffractive optical elementsilluminated by oblique incident plane waves

Authors
Shi, SY Prather, DW
Citation
Sy. Shi et Dw. Prather, Electromagnetic analysis of axially symmetric diffractive optical elementsilluminated by oblique incident plane waves, J OPT SOC A, 18(11), 2001, pp. 2901-2907
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
ISSN journal
10847529 → ACNP
Volume
18
Issue
11
Year of publication
2001
Pages
2901 - 2907
Database
ISI
SICI code
1084-7529(200111)18:11<2901:EAOASD>2.0.ZU;2-X
Abstract
We present an analysis of axially symmetric diffractive optical elements il luminated by off-axis or oblique incident plane waves. The analysis is perf ormed with a finite-difference time-domain method that has been formulated to exploit axial symmetry yet accommodate off-axis illumination. This appro ach is compared with a full three-dimensional formulation and is found to b e more efficient in both memory requirements and computational time. Valida tion and applications of this method are presented. (C) 2001 Optical Societ y of America.