Low temperature polysilicon chemical vapor deposition system for thin filmtransistor liquid crystal diode

Citation
A. Hosokawa et al., Low temperature polysilicon chemical vapor deposition system for thin filmtransistor liquid crystal diode, J VAC SCI B, 19(5), 2001, pp. 1981-1984
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
19
Issue
5
Year of publication
2001
Pages
1981 - 1984
Database
ISI
SICI code
1071-1023(200109/10)19:5<1981:LTPCVD>2.0.ZU;2-K
Abstract
Polysilicon thin film transistor (TFT)-based displays are increasingly foun d in cell phones, mobile communicators, PDAs, portable DVD players, and mob ile computers because they have high resolution and low power consumption. The AKT plasma-enhanced chemical vapor deposition system made by Applied Ma terials is used to deposit multilayer dielectric films including precursor low-hydrogen-content amorphous silicon for manufacturing these displays. Th e polysilicon film is converted from an amorphous precursor film by an exci mer laser annealing process. Production of a good quality polysilicon precu rsor film requires that the hydrogen content of the film be controlled belo w 2%. Achieving low hydrogen content requires uniform treatment at high tem perature (500 +/- 10 degreesC) after deposition. This article describes the design and performance of the large, high temperature heat chamber integra ted in a cluster-tool-based deposition system for both preheat and postanne aling of the substrate. [Q. Shang, T. K. Kardokus, and A. Hosokawa, U.S. pa tent pending (Dec. 2000).] (C) 2001 American Vacuum Society.