Zinc oxide is an important fluorescence material due to its excellent lumin
escence efficiency and low voltage required to produce green light. In this
study, the RF reactive magnetron sputtering system was used to deposit the
transparent (ZnO:Zn) thin films on glass substrates. The effect of RF sput
tering power and heat treatment on the photoluminescence (PL) and resistivi
ty were studied. It has been found that increasing RF sputtering power impr
oves the PL efficiency. After heat treatment in argon atmosphere, the cryst
alline structure of the ZnO film is improved and the (0 0 0 2) preferred or
ientation is enhanced. The resistivity of the as-deposited film cannot be d
etected. After annealing, the resistivity is in the range 10(-1)-10(-3) Ome
ga cm(-1). (C) 2001 Elsevier Science B.V All rights reserved.