The microstructure and properties of Cu films containing insoluble W in as-
deposited and as-annealed conditions have been studied. The Cu-W films cons
ist of non-equilibrium supersaturated solid solutions of W in Cu with nanoc
rystalline microstructures. In this study, Cu-W films have been prepared us
ing an RF magnetron sputter deposition technique. As the tungsten content i
ncreases, the film crystallites decrease in size, suggesting that the addit
ion of tungsten in the Cu-W films plays an important role in the inhibition
of grain growth/coalescence during deposition. Decreasing trend for the de
position rate with the tungsten content in the film is obtained. The film h
ardness and wear resistance properties correlate well with the microstructu
re and governed by the impurity effect of tungsten. Hardness and wear resis
tance results indicate that the strengthening of films is mainly due to the
fine structure and presence of tungsten. Compared to other insoluble eleme
nts such as Mo, Ta and C, W has resulted in a better wear resistance proper
ty when the maximum soluble tungsten content is 11.1 at.% in films. (C) 200
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