Mechanical and electrostatic properties of carbon nanotubes and nanowires

Nano-scale manipulation and property measurements of individual nanowire-li ke structure is challenged by the small size of the structure. Scanning pro be microscopy has been the dominant toot for property characterizations of nanomaterials. We have developed an alternative novel approach that allows a direct measurement of the mechanical and electrical properties of individ ual nanowire-like structures by in situ transmission electron microscopy (T EM). The technique is unique in a way that it can directly correlate the at omic-scale microstructure of the nanowire with its physical properties. Thi s paper reviews our cur-rent progress in applying the technique in investig ating the mechanical and electron field emission properties of carbon nanot ubes and nanowires. (C) 2001 Elsevier Science B.V. All rights reserved.