K. Akahane et al., Formation of lateral-two-dimensional ordering in self-assembled InGaAs quantum dot on high index substrates, PHYSICA E, 11(2-3), 2001, pp. 94-98
The in-plane strain relaxation properties on InGaAs/GaAs(3 1 1)B were inves
tigated by means of reciprocal space mapping using triple axis X-ray diffra
ctometry to study the origin of two-dimensional ordering of InGaAs quantum
dots (QDs) on a GaAs(3 1 1)B substrate. From the X-ray data, the strain rel
axation anisotropy in the InGaAs laver was observed to be larger on the GaA
s(3 1 1)B substrate than on (0 0 1). It is proposed that the large strain a
nisotropy is responsible for the QD ordering observed on the (3 1 1)B surfa
ce. (C) 2001 Elsevier Science B.V. All rights reserved.