The solid phase crystallization of nanometer-thick layers of disordered Si
confined between layers of amorphous SiO2 has been achieved using high temp
erature annealing. For ultrathin Si layers (similar to1-3 mn thick) crystal
lization was not possible even after extensive annealing at temperatures up
to 1100 degreesC, because of the high strain fields introduced by the SiO2
layers. However, for thicker layers (similar to4-20 nm thick) a variety of
Si nanocrystals ranging in shape from spheres to bricks could be spontaneo
usly formed and, in suitable cases, oriented along the < 111 > crystallogra
phic direction. This formation of organized nanocrystals is an important st
ep towards the construction of Si/SiO2 quantum devices. (C) 2001 Elsevier S
cience B.V. All rights reserved.