Deuterium retention and lattice damage in tungsten irradiated with D ions

The depth profiles of D atoms and D-2 Molecules in W single crystals and ho t-rolled W implanted with 6 keV D ions at 300 and 650 K were determined by means of secondary ion mass spectrometry (SIMS) and residual gas analysis ( RGA) measurements in the course of surface sputtering. Retention of deuteri um and lattice damage in W single crystal irradiated with 10 keV D ions at 300 K were investigated by means of nuclear reaction analysis (NRA) and Rut herford backscattering spectrometry and ion channelling techniques (RBS/C). There are at least two types of ion-induced defects which are responsible for trapping of deuterium: (i) D-2-filled microvoids (deuterium bubbles) lo calised in the implantation zone and (H) dislocations distributed from the surface to depths far beyond 1 mum which capture deuterium in the form of D atoms. Additionally, D atoms can be trapped by vacancies and adsorbed on b ubble walls. At 650 K, deuterium is retained as D atoms only.