S. Nagata et K. Takahiro, Effect of carbon and oxygen enriched layer on retention and release of deuterium implanted in tungsten and molybdenum, PHYS SCR, T94, 2001, pp. 106-110
Retention and thermal release of D atoms implanted into W and Mo containing
carbon or oxygen in the surface layers were studied by ion beam analysis t
echniques. Ion implanted D atoms accumulated within the surface oxide layer
on Mo and W crystals to a high concentration at room temperature, although
the D distribution in the substrate crystal was not strongly affected by t
he large retention in the surface. When the oxide layer was filled with a h
igh density of D atoms, it was reduced by subsequent D ion implantation at
room temperature and by heat treatment, especially for Mo crystals. A carbo
n-enriched layer on the Mo crystal retained a large amount of D atoms and a
lso significantly enhanced the D trapping in the substrate crystal at room
temperature, D atoms were weakly trapped in the substrate crystal as well a
s in the interface where strain fields seemed to be created simultaneously
with D retention.