Atomic force microscope chamber for in situ studies of ice

Citation
S. Zepeda et al., Atomic force microscope chamber for in situ studies of ice, REV SCI INS, 72(11), 2001, pp. 4159-4163
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
72
Issue
11
Year of publication
2001
Pages
4159 - 4163
Database
ISI
SICI code
0034-6748(200111)72:11<4159:AFMCFI>2.0.ZU;2-7
Abstract
To investigate the surface morphologies of biological systems in a controll ed gaseous environment (e.g., the temperature, humidity and composition), m ost commercial atomic force microscopes require modification. We have desig ned a double-jacketed environmental chamber specifically for a Nanoscope II Ia (Digital Instruments, Santa Barbara, CA) force microscope. We use cold n itrogen and thermoelectric devices to control the temperature in the chambe r; the nitrogen simultaneously serves to create an inert environment. We ha ve also designed a temperature controlled sample stage utilizing thermoelec tric devices for fine temperature regulation. A variation of this sample st age allows us to image samples in fluids at cold temperatures with an O-rin gless configuration. The relative humidity within the chamber is also measu red with commercially available relative humidity sensors. We investigate t he surface morphology of ice Ih in its pure phase and shall extend the stud y to ice in the presence of biological molecules, such as antifreeze protei ns. We present a detailed description of our design and our first images of polycrystalline ice and single crystals of ice grown in situ from the vapo r. (C) 2001 American Institute of Physics.