Tribological properties of sputtered tungsten and tungsten nitride thin films

Citation
Km. Wong et al., Tribological properties of sputtered tungsten and tungsten nitride thin films, SCI CHINA A, 44, 2001, pp. 242-247
Citations number
9
Categorie Soggetti
Multidisciplinary
Journal title
SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY
ISSN journal
10016511 → ACNP
Volume
44
Year of publication
2001
Supplement
S
Pages
242 - 247
Database
ISI
SICI code
1001-6511(200108)44:<242:TPOSTA>2.0.ZU;2-2
Abstract
The surface roughness, hardness and tribological properties of tungsten (W) and tungsten nitride (WNx) thin films prepared by dc magnetron sputtering and reactive magnetron sputtering in Ar-N-2 gas mixtures have been studied using atomic force microscopy (AFM), nanoindentation measurements and ball- on-disc wear testing. A pronounced surface roughness was observed only for films under compressive strains. The surface was flat under tension but rou gh under compression. Similar hardness with value about 20 GPa were observe d in the W and WNx (x=0.3) films. This is thought to be due to the fact the grains are restricted to a very small size in the coatings. The higher coe fficients of friction (0.4 for W and 0.9 for WN0.3) suggest that WN0.3 is n ot the optimum phase. Finally, discussions are made with tribological test results.