TOF-SIMS analysis: Application to ultra-thin AWA film on magnetic head

Authors
Jiang, ZC Liu, YW Chung, WF Cheung, CY Yagi, I Tian, H
Citation
Zc. Jiang et al., TOF-SIMS analysis: Application to ultra-thin AWA film on magnetic head, SCI CHINA A, 44, 2001, pp. 393-399
Citations number
6
Categorie Soggetti
Multidisciplinary
Journal title
SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY
ISSN journal
10016511 → ACNP
Volume
44
Year of publication
2001
Supplement
S
Pages
393 - 399
Database
ISI
SICI code
1001-6511(200108)44:<393:TAATUA>2.0.ZU;2-3
Abstract
F-containing polymer was coated on the magnetic head of hard disc drive (HD D) as the ultra-thin (< 20 Angstrom) film of anti-wetting agent (AWA). A st atic TOF-SIMS method has been applied to measuring the thickness and coatin g uniformity of the ultra-thin film. TOF-SIMS is also used to study the mic ro-tribology and transfer of lubricant between the magnetic head and media interface.