Formation of anomalously wide Si(111)root 3 x root 3 clean surface and itsstability

Citation
H. Minoda et al., Formation of anomalously wide Si(111)root 3 x root 3 clean surface and itsstability, SURF SCI, 493(1-3), 2001, pp. 157-165
Citations number
13
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
493
Issue
1-3
Year of publication
2001
Pages
157 - 165
Database
ISI
SICI code
0039-6028(20011101)493:1-3<157:FOAWS3>2.0.ZU;2-D
Abstract
High-temperature scanning tunneling microscope observation has been perform ed to investigate formation of a Si(111)root3 x root3 structure and its sta bility on a quenched surface. Formation of anomalously wide Si(111)root3 x root3 domains was observed by increasing adatom density of Si on quenched s urface below the transition temperature between disordered "1 x 1" and orde red simple adatom structures. By adding Si adatoms most of the simple adato m structure transformed into the root3 x root3 structure. Domain boundaries between adjacent root3 x root3 domains are straight and along the (110) di rection, The root3 x v root3 structure transforms into the 2 x n structure by annealing and Si cluster increases in number to maintain Si adatom densi ty on the surface. This indicates that the 2 x n structure is energetically more stable than the root3 x root3 structure. (C) 2001 Elsevier Science BN . All rights reserved.