K. Mallika et R. Komanduri, Low pressure microwave plasma assisted chemical vapor deposition (MPCVD) of diamond coatings on silicon nitride cutting tools, THIN SOL FI, 396(1-2), 2001, pp. 145-165
Diamond coatings were deposited on commercial silicon nitride (Si3N4) cutti
ng tools by low pressure microwave plasma assisted chemical vapor depositio
n (MPCVD) at various processing conditions to assess the quality and adhesi
on of diamond coatings. A four-factor, three-level fractional factorial exp
erimental design methodology was used to determine the significance. of the
process variables, such as the microwave chamber pressure, substrate tempe
rature, microwave power and % CH4 concentration in the hydrocarbon-hydrogen
mixture. The reactor pressure was found to have the strongest influence on
nucleation followed by the temperature and the % CH4 concentration. Microw
ave power was found to have a minimum influence on nucleation. It was also
found that nucleation density decreases with increase in pressure, while it
increases with increase in the % CH4 concentration. Substrate temperature
and % CH4 concentration were found to be the most crucial parameters dictat
ing the overall growth rate as well as the quality of the diamond films. Di
amond-coated Si3N4 tools were characterized by mu -Raman spectroscopy and s
canning electron microscopy. The former was used to assess the quality of t
he diamond coatings (phase purity as well as the amount of amorphous carbon
associated with the sp(2) structure) as well as the residual stresses on t
he tools. The relative intensity of the non-diamond to the crystalline diam
ond was found to decrease with increase in the microwave chamber pressure.
Higher microwave power was found to increase the intensity of the crystalli
ne diamond and decrease the non-diamond peak intensity. The morphology of d
iamond coatings was assessed using an SEM. The diamond film deposited were
qualitatively assessed for adhesion using the Rockwell hardness tester with
a Brale indenter and an abrasion wear tester. A chamber pressure of simila
r to 20 torr (2.65 kPa); a microwave power of similar to 1000 W; a CH4 conc
entration of 0.5-1 %; and a substrate temperature in the range of 850-900 d
egreesC, were identified as the optimum deposition conditions for producing
good quality diamond coatings on Si3N4 substrate. (C) 2001 Elsevier Scienc
e B.V. All rights reserved.