Reflectance and transmittance of a slightly inhomogeneous thin film bounded by rough, unparallel interfaces

Citation
M. Montecchi et al., Reflectance and transmittance of a slightly inhomogeneous thin film bounded by rough, unparallel interfaces, THIN SOL FI, 396(1-2), 2001, pp. 262-273
Citations number
34
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
396
Issue
1-2
Year of publication
2001
Pages
262 - 273
Database
ISI
SICI code
0040-6090(20010921)396:1-2<262:RATOAS>2.0.ZU;2-3
Abstract
Inhomogeneity of a thin film, rough interfaces of the film with air and sub strate and non-parallelism of these interfaces severely affect reflectance and transmittance. Neglecting these film imperfections could give rise to e rroneous optical characterisation of the film from measured spectra. Each o ne of these imperfections, considered alone, has its own characteristic inf luence on the interference fringes of the reflectance and transmittance spe ctra. In this work, a model of an inhomogeneous thin film bounded by rough, unparallel interfaces is introduced for calculating reflectance and transm ittance at normal incidence. The effects on the spectra due to roughness as predicted by the proposed model are compared with those evaluated by an ap proach involving the effective-medium approximation (EMA). In this latter a pproach, a thin transition layer replaces the rough interface, but it prove s inadequate for reproducing the transmittance spectrum. Finally, the model is successfully applied to the characterisation of a LiF film thermally ev aporated on a glass substrate. (C) 2001 Elsevier Science B.V. All rights re served.