Nanometer spot allocation for Raman spectroscopy on ferroelectrics by polarization and piezoresponse force microscopy

Citation
G. Tarrach et al., Nanometer spot allocation for Raman spectroscopy on ferroelectrics by polarization and piezoresponse force microscopy, APPL PHYS L, 79(19), 2001, pp. 3152-3154
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
19
Year of publication
2001
Pages
3152 - 3154
Database
ISI
SICI code
0003-6951(20011105)79:19<3152:NSAFRS>2.0.ZU;2-#
Abstract
We report the 100% correlation between polarized light microscopy (PLM), pi ezoresponse force microscopy (PFM), and micro-Raman spectroscopy when inves tigating domain-rich ferroelectric systems. In order to allocate the desire d spot on a submicrometer scale, both PLM and PFM were combined to elucidat e the effective three-dimensional ferroelectric domain distribution. With P FM we observe spike-like a and c domains well inside extended a and c-polar ized areas, which were not conclusive with PLM. The knowledge on such a dom ain distribution is essential when addressing quantitative micro-Raman spec troscopy. In addition, we show the unambiguous differentiation between a an d c domains on the submicrometer scale using the B-2 mode of lattice vibrat ions. (C) 2001 American Institute of Physics.