Quantitative imaging of magnetic domain walls in thin films using Lorentz and magnetic force microscopies

Images of a thin film permalloy element taken with Lorentz and magnetic for ce microscopies are compared with those from a simulation of the expected m agnetic structure of the element. Measurements taken from the domain walls present in the element allow a quantitative comparison to be made. In the c ase of magnetic force microscopy, quantification is made possible by using a nonperturbative approach based on an extended charge model for the magnet ic probe. Excellent agreement between experiment and simulation is observed for both imaging techniques. (C) 2001 American Institute of Physics.