The influence of crystallization route on the Bi4Ti3O12 thin films by chemical solution deposition technique

Citation
Zb. Xiao et al., The influence of crystallization route on the Bi4Ti3O12 thin films by chemical solution deposition technique, MATER LETT, 51(3), 2001, pp. 240-244
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS LETTERS
ISSN journal
0167577X → ACNP
Volume
51
Issue
3
Year of publication
2001
Pages
240 - 244
Database
ISI
SICI code
0167-577X(200111)51:3<240:TIOCRO>2.0.ZU;2-8
Abstract
The thickness of the monolayer thin film made from chemical solution deposi tion (CSD) is often less than 0.1 mum, and in order to get thicker film, mu ltiple coating is unavoidable. In our work, we found that different crystal lization routes greatly influence the structural and electrical properties of the films. The leakage cur-rent density and dielectric constant of the f ilms prepared by intermediate crystallized layer route are smaller than tho se of the films made from the intermediate amorphous layer route. The coerc ive field of the former is bigger than that of the latter, while the remane nt polarization of the former is smaller than that of the latter. (C) 2001 Elsevier Science B.V. All rights reserved.