Oriented zeolite MFI monolayer films on metal substrates by in situ crystallization

Authors
Citation
Zb. Wang et Ys. Yan, Oriented zeolite MFI monolayer films on metal substrates by in situ crystallization, MICROP M M, 48(1-3), 2001, pp. 229-238
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
MICROPOROUS AND MESOPOROUS MATERIALS
ISSN journal
13871811 → ACNP
Volume
48
Issue
1-3
Year of publication
2001
Pages
229 - 238
Database
ISI
SICI code
1387-1811(20011101)48:1-3<229:OZMMFO>2.0.ZU;2-R
Abstract
Continuous b-oriented zeolite MFI monolayer films (<0.4 pm thick) were prep ared by in situ crystallization on metal substrates (stainless steel and al uminum alloy) using a synthesis solution 0.32TPAOH:TEOS:165H(2)O (TPAOH: te tra-propylammonium hydroxide, TEOS: tetraethylorthosilicate). Effects of cr ystallization temperature and time, surface roughness, position and chemica l nature of the substrate, and aging time of the synthesis solution were in vestigated and a mechanism for the b-oriented monolayer thin film formation was discussed. The supported films were characterized with scanning electr on microscopy and X-ray diffraction. Polishing of the film with a normal la b polisher leads to a continuous ultrathin zeolite film with a surface roug hness less than 0.05 mum. (C) 2001 Elsevier Science B.V. All rights reserve d.