Continuous b-oriented zeolite MFI monolayer films (<0.4 pm thick) were prep
ared by in situ crystallization on metal substrates (stainless steel and al
uminum alloy) using a synthesis solution 0.32TPAOH:TEOS:165H(2)O (TPAOH: te
tra-propylammonium hydroxide, TEOS: tetraethylorthosilicate). Effects of cr
ystallization temperature and time, surface roughness, position and chemica
l nature of the substrate, and aging time of the synthesis solution were in
vestigated and a mechanism for the b-oriented monolayer thin film formation
was discussed. The supported films were characterized with scanning electr
on microscopy and X-ray diffraction. Polishing of the film with a normal la
b polisher leads to a continuous ultrathin zeolite film with a surface roug
hness less than 0.05 mum. (C) 2001 Elsevier Science B.V. All rights reserve
d.