Interferometric measurementes of photothermal deflection

Authors
Corona-Organiche, E Lopez-Cruz, E
Citation
E. Corona-organiche et E. Lopez-cruz, Interferometric measurementes of photothermal deflection, MOD PHY L B, 15(17-19), 2001, pp. 613-616
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
MODERN PHYSICS LETTERS B
ISSN journal
02179849 → ACNP
Volume
15
Issue
17-19
Year of publication
2001
Pages
613 - 616
Database
ISI
SICI code
0217-9849(20010820)15:17-19<613:IMOPD>2.0.ZU;2-6
Abstract
The photothermal technique has been applied for the thermal diffusivity mea surements, These measurements based on interferometric photothermal deflect ion effect were made on ZnxCd1-xTe (x = 5%, 10% and 20%). A simple one-dime nsional model is presented to obtain the thermal diffusivity for semiconduc tor materials in the case of a thermally thick sample that is optically opa que.