Characterization of doped sillenites by electrooptic and spectral methods

Citation
A. Ilinskii et al., Characterization of doped sillenites by electrooptic and spectral methods, MOD PHY L B, 15(17-19), 2001, pp. 749-751
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
MODERN PHYSICS LETTERS B
ISSN journal
02179849 → ACNP
Volume
15
Issue
17-19
Year of publication
2001
Pages
749 - 751
Database
ISI
SICI code
0217-9849(20010820)15:17-19<749:CODSBE>2.0.ZU;2-H
Abstract
The main result of this paper was the high accurate characterization of the investigated samples. We were able to measure the Maxwell relaxation time for doped (Al, Cr, Mn Ti Nd) and undoped sillenite crystals was determined. The obtained values are as large as 10(3) S. Also, the correlation between spectroscopic electrical and electrooptical properties of doped sillenite crystals was established.