J. Cardoso et al., Conductive copper sulfide thin films on polyimide foils for optical and optoelectronic applications, MOD PHY L B, 15(17-19), 2001, pp. 774-777
Copper sulfide thin films of 75 nm and 100 mn thickness were coated on Kapt
on foils (PI) of 25 mn thickness by floating them on a chemical bath. The f
oils were annealed at 150 degreesC-400 degreesC in N-2 converting the coati
ng from CuS to Cu1.8S. The sheet resistance of the annealed coatings (100 n
m) is 10-50 ohms/square which is almost unaltered after immersion in dilute
HCl for 30-120 min. The infrared reflectance predicted for the coatings is
67%-77% at a wavelength 2.5 mum, which is nearly what is experimentally ob
served. The coated PI has a transmittance (25-35%) peak located around 550-
600 nm. These thermally stable conductive coatings on PI foils might be use
d as conductive substrates for optoelectronic device structures.