Combined photothermal and photoacoustic characterization of silicon-epoxy composites and the existence of a particle thermal percolation threshold

Citation
Me. Rodriguez et al., Combined photothermal and photoacoustic characterization of silicon-epoxy composites and the existence of a particle thermal percolation threshold, NUCL INST B, 184(3), 2001, pp. 421-429
Citations number
21
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
184
Issue
3
Year of publication
2001
Pages
421 - 429
Database
ISI
SICI code
0168-583X(200111)184:3<421:CPAPCO>2.0.ZU;2-6
Abstract
Photoacoustic (PA) and photothermal radiometric (PTR) detection were used t o characterize thermal properties of silicon-epoxy composite materials in t he volume range 0% < x < 32 vol% (50 mum). PA detection was used to study t he variation of the thermal diffusivity as a function of Si volume fraction , and PTR was used to determine the influence of the electronic carrier con tribution to the thermal transport with the optical properties taken into c onsideration. The combined PA and PTR measurements show that there exists n o linear relation between thermal diffusivity and silicon volume fraction. Thermal diffusivity and optical absorption coefficient measurements can be obtained by means of combined PA and PTR measurements. Both parameters exhi bit anomalous behavior in the 16% Si volume fraction range, corroborating t he existence of a particle percolation threshold for three-dimensional rand om close packed (rep) solids. (C) 2001 Elsevier Science B.V. All rights res erved.