Characterization of anisotropic structure in poly(phenylene vinylene) films

Citation
Rq. Ou et al., Characterization of anisotropic structure in poly(phenylene vinylene) films, POLYM ENG S, 41(10), 2001, pp. 1705-1713
Citations number
18
Categorie Soggetti
Material Science & Engineering
Journal title
POLYMER ENGINEERING AND SCIENCE
ISSN journal
00323888 → ACNP
Volume
41
Issue
10
Year of publication
2001
Pages
1705 - 1713
Database
ISI
SICI code
0032-3888(200110)41:10<1705:COASIP>2.0.ZU;2-W
Abstract
The evolution of the anisotropic structure in poly(phenylene vinylene) (PPV ) films was studied using three nondestructive characterization techniques: prism waveguide coupling, infrared dichroism, and X-ray diffraction. The a nisotropic PPV films were thermally converted from precursor drawn films at fixed length. The three-dimensional refractive indices, infrared dichroic ratios, crystal alignment, and orientation function were determined from ea ch film. The results show that converted cast PPV film has a highly planar structure with a tendency for the PPV chains to orient parallel to the film surface. The a axis of the crystal unit cell is normal to the film plane. One-way stretching converts the film from a planar structure to a uniaxial structure.