Physical foundations of metastable impurity center reconstruction in semiconductors

Citation
De. Onopko et Ai. Ryskin, Physical foundations of metastable impurity center reconstruction in semiconductors, SEMICONDUCT, 35(11), 2001, pp. 1223-1230
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTORS
ISSN journal
10637826 → ACNP
Volume
35
Issue
11
Year of publication
2001
Pages
1223 - 1230
Database
ISI
SICI code
1063-7826(2001)35:11<1223:PFOMIC>2.0.ZU;2-E
Abstract
The manner in which the electronic structure and chemical bonding of a perf ect crystal change upon doping and vary with the charge state of a defect i s analyzed. The obtained results serve as a basis for proposing a general p attern of reconstruction of metastable impurity centers, of both donor and acceptor types, in various semiconductors: "classical" III-V and II-VI semi conductor compounds, mostly ionic CdF2 crystal, and narrow-gap IV-VI compou nds. Reasons are revealed for center reconstruction; general tendencies of the process and the specificity of their manifestation in some classes of c rystals and types of impurity centers are established. (C) 2001 MAIK "Nauka /Interperiodica".