Degradation characteristics of p-i-n BeZnSe/Zn(Be)CdSe light-emitting diode
s were investigated. Undoped short-period superlattices, which provide effi
cient hole transport from the p(+)-BeTe:N near-contact region (hole injecto
r) into the active region, were used instead of the p-doped BeZnSe:N emitte
r. It is demonstrated that this makes it possible to considerably lengthen
the operating life of the light-emitting diodes at highest direct current d
ensities (similar to4.5 kA/cm(2)) at room temperature. (C) 2001 MAIK "Nauka
/ Interperiodica".