Simulations of X-ray photoelectron diffraction experiment from theoreticalcalculations

Citation
Jc. Zheng et al., Simulations of X-ray photoelectron diffraction experiment from theoreticalcalculations, SURF REV L, 8(5), 2001, pp. 549-557
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SURFACE REVIEW AND LETTERS
ISSN journal
0218625X → ACNP
Volume
8
Issue
5
Year of publication
2001
Pages
549 - 557
Database
ISI
SICI code
0218-625X(200110)8:5<549:SOXPDE>2.0.ZU;2-X
Abstract
In this paper, we demonstrate the simulation of XPD experiments through the oretical calculations. We present examples, e.g. oxygen-induced Cu(210) sur face and oxygenated diamond surface, to illustrate how to obtain the optimi zed XPD experimental parameters by MSCD simulations for distinguishing two different models. Our results suggest that for the adsorbate-induced recons tructions on metal or semiconductor surfaces, XPD from adsorbate is more se nsitive to the detailed surface structure than XPD from bulk elements. Whet her to choose energy-scanned or angle-scanned mode will depend on the syste ms under investigation. One should check any limitations in the instruments used, and then perform the theoretical simulations for typical available p arameters in order to select the best mode, emitters, and optimized paramet ers.