Thin films of silicon nanoparticles embedded in Al2O3 matrices

Authors
Citation
Y. Zhu et Pp. Ong, Thin films of silicon nanoparticles embedded in Al2O3 matrices, SURF REV L, 8(5), 2001, pp. 559-564
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SURFACE REVIEW AND LETTERS
ISSN journal
0218625X → ACNP
Volume
8
Issue
5
Year of publication
2001
Pages
559 - 564
Database
ISI
SICI code
0218-625X(200110)8:5<559:TFOSNE>2.0.ZU;2-9
Abstract
Silicon nanoparticles embedded in a host matrix of Al2O3 thin film about 26 0 nm thick were prepared by using the pulsed laser deposition method. The l aser target consisted of a small silicon wafer glued onto the surface of a circular Al2O3 plate, which was set to rotate uniformly when laser-ablating . TEM and EDS results showed that the films consisted of silicon nanopartic les in the form of nanocrystals with diameters of less than 6 nm dispersed in the amorphous Al2O3 matrices. Strong PL from the as-prepared and the ann ealed samples was observed. The SIMS depth profile of the silicon content o f the film indicated that the silicon nanoparticles in the Al2O3 matrices w ere arranged in fairly well demarcated thin layers sandwiched between layer s of the host material. FTIR results evidently suggested that the encapsula ting amorphous Al2O3 material forms a good host for the prevention of atmos pheric oxidation of the silicon nanoparticles. However, prolonged annealing can cause the silicon nanoparticle surface interfacing the host material t o be oxidized by the oxygen mostly from the Al2O3 molecules and be bonded t o the Al or O-Al bonds.