Silicon nanoparticles embedded in a host matrix of Al2O3 thin film about 26
0 nm thick were prepared by using the pulsed laser deposition method. The l
aser target consisted of a small silicon wafer glued onto the surface of a
circular Al2O3 plate, which was set to rotate uniformly when laser-ablating
. TEM and EDS results showed that the films consisted of silicon nanopartic
les in the form of nanocrystals with diameters of less than 6 nm dispersed
in the amorphous Al2O3 matrices. Strong PL from the as-prepared and the ann
ealed samples was observed. The SIMS depth profile of the silicon content o
f the film indicated that the silicon nanoparticles in the Al2O3 matrices w
ere arranged in fairly well demarcated thin layers sandwiched between layer
s of the host material. FTIR results evidently suggested that the encapsula
ting amorphous Al2O3 material forms a good host for the prevention of atmos
pheric oxidation of the silicon nanoparticles. However, prolonged annealing
can cause the silicon nanoparticle surface interfacing the host material t
o be oxidized by the oxygen mostly from the Al2O3 molecules and be bonded t
o the Al or O-Al bonds.