Effect of Ta and Ta/Cu buffers on the exchange bias field of NiFe/FeMn bilayers

Citation
Mh. Li et al., Effect of Ta and Ta/Cu buffers on the exchange bias field of NiFe/FeMn bilayers, ACT PHY C E, 50(11), 2001, pp. 2230-2234
Citations number
16
Categorie Soggetti
Physics
Journal title
ACTA PHYSICA SINICA
ISSN journal
10003290 → ACNP
Volume
50
Issue
11
Year of publication
2001
Pages
2230 - 2234
Database
ISI
SICI code
1000-3290(200111)50:11<2230:EOTATB>2.0.ZU;2-V
Abstract
The NiFe/FeMn bilayers with different buffer layers (Ta or Ta/Cu) and Ta co ver layers were prepared by magnetron sputtering. The results showed that t he exchange bias field of NiFe/FeMn films with the Ta buffer was higher tha n that of the films with the Ta/Cu buffer. We investigated the crystallogra phic, texture, surface roughness and surface segregation, and demonstrated that the decrease of the exchange coupling field was caused by the Cu surfa ce segregation in NiFe/FeMn films with Ta/Cu buffer layers.