Triple junction and grain boundary orientations were obtained by elect
ron backscattered diffraction in high purity aluminium and copper, and
in copper-bismuth alloys, and were then characterized using the CSL,
CAD and I-line (O-lattice) geometrical models. A computer simulation w
as also performed and compared to the experimental results. Relationsh
ips were established between triple junction and grain boundary charac
ter distributions using both experimental and computer simulated resul
ts. A general trend was observed which shows an increase in special tr
iple junction character density with increasing special grain boundary
character content. An increased frequency of low angle and twin bound
aries is shown to lead to an increase in the I-line triple junction de
nsity. (C) 1997 Acta Metallurgica Inc.