Effect of Cu surface segregation on the exchange coupling field of NiFe/FeMn bilayers

Citation
Mh. Li et al., Effect of Cu surface segregation on the exchange coupling field of NiFe/FeMn bilayers, CHIN SCI B, 46(22), 2001, pp. 1934-1936
Citations number
11
Categorie Soggetti
Multidisciplinary
Journal title
CHINESE SCIENCE BULLETIN
ISSN journal
10016538 → ACNP
Volume
46
Issue
22
Year of publication
2001
Pages
1934 - 1936
Database
ISI
SICI code
1001-6538(200111)46:22<1934:EOCSSO>2.0.ZU;2-A
Abstract
The NiFe/FeMn bilayers with different buffer layers (Th or Ta/Cu) were prep ared by magnetron sputtering Results show that the exchange coupling field of NiFe/FeMn films with Th buffer is higher than that of the films with Ta/ Cu buffer. We analysed the reasons by investigating the crystallographic te xture, surface roughness and surface segregation of both films, respectivel y. We found that the decrease of the exchange coupling fields of NiFe/FeMn films with Ta/ Cu buffer layers was mainly caused by the Cu surface segrega tion on NiFe surface.