Growth and X-ray characterization of ScFe4Al8 single crystals

Authors
Talik, E Winiarski, A Kotur, B Suski, W
Citation
E. Talik et al., Growth and X-ray characterization of ScFe4Al8 single crystals, CRYST RES T, 36(8-10), 2001, pp. 1119-1122
Citations number
3
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTAL RESEARCH AND TECHNOLOGY
ISSN journal
02321300 → ACNP
Volume
36
Issue
8-10
Year of publication
2001
Pages
1119 - 1122
Database
ISI
SICI code
0232-1300(2001)36:8-10<1119:GAXCOS>2.0.ZU;2-#
Abstract
Single crystals of the ScFe4Al8 intermetallic compound were obtained by the Czochralski method from a levitated melt. The X-ray powder diffraction, La ue and Berg-Barrett reflection topographies exhibit that the obtained singl e crystals were a good quality. The lattice parameters a = 8.652 +/- 0.004 Angstrom, c = 5.020 +/- 0.003 Angstrom were calculated from powder diffract ion patterns.