ONE-DIMENSIONAL MODELING OF POWER REFLECTION IN MICROWAVE-DETECTED PHOTOCONDUCTANCE DECAY MEASUREMENT

A mathematical model based on a recursive reflection relation is devel oped and used for the calculation of the microwave power reflection in a Microwave Detected Photoconductance Decay carrier lifetime measurin g system. Electrical equivalent circuit modeling of the same system is also proposed and used in the determination of the microwave reflecta nce and in the derivation of simple analytical closed form expressions for the optimum values of the measurement parameters. Treating the sy stem using the electrical equivalent circuit model is found to be very convenient since it has proven to be accurate for electrically thin s ingle layers as well as for multiple layer samples.