This paper describes a real-time electro-optic (EO) probe system that can b
e directly connected to digital oscilloscopes, spectrum analyzers, and othe
r widely used instruments. The probe incorporates a balanced optical receiv
er with two high-speed InGaAs p-i-n photodetectors (PDs) to reduce noise, a
nd optical isolators to decrease the light reflected from the optics back t
o the laser diode (LD). To increase sensitivity, we employ cadmium tellurid
e (CdTe), which has a large EO coefficient, and a high-power 1.3-mum distri
buted-feedback (DFB) LD as a continuous-wave (CW) laser source. We used it
to measure eye diagrams at 1 Gb/s that were displayed on a digital oscillos
cope. In addition, when connected to a spectrum analyzer, the probe signifi
cantly simplifies frequency-domain analysis. We demonstrate the measurement
of electric nearfield distribution radiating from a two-layer printed circ
uit board (PCB) and a cellular phone. The result shows that the probe syste
m is a potential candidate for electromagnetic interference (EMI) instrumen
ts.