The rectangular dielectric waveguide (RDWG) technique has been developed fo
r the determination of the dielectric constant of materials from effective
refractive index measurements in the Q and W bands. This paper describes th
e use of an optimization method in conjunction with the RDWG technique for
the determination of both the dielectric constant and loss tangent of mater
ials at Ka-Band. The effect of the uncertainty in the measured sample thick
ness is presented.