Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide

Citation
Z. Abbas et al., Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide, IEEE INSTR, 50(5), 2001, pp. 1334-1342
Citations number
23
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
50
Issue
5
Year of publication
2001
Pages
1334 - 1342
Database
ISI
SICI code
0018-9456(200110)50:5<1334:CPMAKU>2.0.ZU;2-6
Abstract
The rectangular dielectric waveguide (RDWG) technique has been developed fo r the determination of the dielectric constant of materials from effective refractive index measurements in the Q and W bands. This paper describes th e use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of mater ials at Ka-Band. The effect of the uncertainty in the measured sample thick ness is presented.