A line-line (LL) method for measuring the permittivity of materials up to m
illimeter waves is proposed. It is based on a property of the well-known li
ne-return-line (LRL) calibration technique developed for microwave circuits
: the complex propagation constant of the two-line calibration standards ca
n be extracted from the raw measurement of these two lines. Using this feat
ure for a dielectrometric purpose, we combine this LL formulation with accu
rate models for the propagation constant to extract from the measured value
the permittivity of the medium surrounding, or contained in, the LL calibr
ation lines. Choosing the line topology (planar, coaxial, or waveguide) acc
ording to the nature and consistency of the material under consideration yi
elds the permittivity of a wide variety of materials. In this paper, we dem
onstrate the efficiency of the method for three kinds of substances: organi
c liquids, soils, and planar dielectric substrates used for microwave plana
r circuits. Advantages particular to each application are detailed in the p
aper.