Growth and characterization of aligned carbon nanotubes from patterned nickel nanodots and uniform thin films

Citation
Jg. Wen et al., Growth and characterization of aligned carbon nanotubes from patterned nickel nanodots and uniform thin films, J MATER RES, 16(11), 2001, pp. 3246-3253
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS RESEARCH
ISSN journal
08842914 → ACNP
Volume
16
Issue
11
Year of publication
2001
Pages
3246 - 3253
Database
ISI
SICI code
0884-2914(200111)16:11<3246:GACOAC>2.0.ZU;2-T
Abstract
Microstructures of well-aligned multiwall carbon nanotubes grown on pattern ed nickel nanodots and uniform thin films by plasma-enhanced chemical vapor deposition have been studied by electron microscopy. It was found that gro wth of carbon nanotubes on patterned nickel nanodots and uniform thin films is different. During growth of carbon nanotubes, a nickel particle sits at the tip of each nanotube, and its [220] is preferentially oriented along t he plasma direction, which can be explained by a channeling effect of ions coming into nickel particles in plasma. The alignment of nanotubes is induc ed by the electrical field direction relative to substrate surface.