Scanning electron microscope investigations of highly conducting organic composites

Citation
M. Golub et al., Scanning electron microscope investigations of highly conducting organic composites, J MATER SCI, 36(23), 2001, pp. 5543-5550
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
36
Issue
23
Year of publication
2001
Pages
5543 - 5550
Database
ISI
SICI code
0022-2461(200112)36:23<5543:SEMIOH>2.0.ZU;2-S
Abstract
Scanning electron microscope (SEM) investigation of the highly conducting o rganic composites of general formulae (BEDT-TTF)(x)/(AuI) and (BEDT-TTF)(x) /(AuI3), where BEDT-TTF is bis(ethylenedithio)tetrathiafulvalene, obtained by direct charge-transfer (CT) reaction in the solid state is performed. Th e granular structure of the composites with domination of three types of th e grains: (BEDT-TTF)(2)I-3, (BEDT-TTF)(2)AuI2 and Au, is suggested. The cha nges in the composite structure caused by their composition and/or thermal treatment are connected with the d.c. electrical conductivity of the sample s. (C) 2001 Kluwer Academic Publishers.