Dielectric dispersion in ZnF2-Bi2O3-TeO2 glass system

Authors
Durga, DK Veeraiah, N
Citation
Dk. Durga et N. Veeraiah, Dielectric dispersion in ZnF2-Bi2O3-TeO2 glass system, J MATER SCI, 36(23), 2001, pp. 5625-5632
Citations number
42
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
36
Issue
23
Year of publication
2001
Pages
5625 - 5632
Database
ISI
SICI code
0022-2461(200112)36:23<5625:DDIZGS>2.0.ZU;2-E
Abstract
Dielectric constant epsilon', loss tan delta and ac conductivity sigma of Z nF2-Bi2O3-TeO2 glasses with varying concentrations of Bi2O3 (from 5 to 20%) are studied as a function of frequency and temperature over moderately wid e ranges. The dielectric breakdown strength for these glasses is also deter mined in air medium. From the analysis of these studies along with the IR s pectra & DTA recordings of these glasses, the structural changes in ZnF2-Bi 2O3-TeO2 glass system with change in the concentration of Bi2O3, are discus sed. (C) 2001 Kluwer Academic Publishers.